Detector Systems and Sensor Technologies

Speedster-EXD: a new event-driven hybrid CMOS x-ray detector

[+] Author Affiliations
Christopher V. Griffith, Abraham D. Falcone, Zachary R. Prieskorn, David N. Burrows

Pennsylvania State University, Department of Astronomy and Astrophysics, 525 Davey Lab, University Park, Pennsylvania 16802, United States

J. Astron. Telesc. Instrum. Syst. 2(1), 016001 (Jan 07, 2016). doi:10.1117/1.JATIS.2.1.016001
History: Received July 8, 2015; Accepted December 2, 2015
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Abstract.  The Speedster-EXD is a new 64×64  pixel2, 40-μm  pixel pitch, 100-μm depletion depth hybrid CMOS x-ray detector with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain capacitive transimpedance amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel correlated double sampling subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5%) at 5.89 keV and 172 eV (10.0%) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25%±0.2% (i.e., consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80%±0.03%, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Topics

Sensors ; X-rays

Citation

Christopher V. Griffith ; Abraham D. Falcone ; Zachary R. Prieskorn and David N. Burrows
"Speedster-EXD: a new event-driven hybrid CMOS x-ray detector", J. Astron. Telesc. Instrum. Syst. 2(1), 016001 (Jan 07, 2016). ; http://dx.doi.org/10.1117/1.JATIS.2.1.016001


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