Detector Systems and Sensor Technologies

Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K

[+] Author Affiliations
Jason P. D. Gow, Daniel Wood, Neil J. Murray, David J. Hall, Ben Dryer, Andrew D. Holland

The Open University, Centre for Electronic Imaging, Department of Physical Sciences, Milton Keynes MK7 6AA, United Kingdom

David Burt

e2v Technologies PLC, 106 Waterhouse Lane, Chelmsford, Essex CM1 2QU, United Kingdom

J. Astron. Telesc. Instrum. Syst. 2(2), 026001 (Jun 09, 2016). doi:10.1117/1.JATIS.2.2.026001
History: Received November 16, 2015; Accepted May 13, 2016
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Abstract.  The displacement damage hardness that can be achieved using p-channel charge-coupled devices (CCD) was originally demonstrated in 1997, and since then a number of other studies have demonstrated an improved tolerance to radiation-induced charge transfer inefficiency when compared to n-channel CCDs. A number of recent studies have also shown that the temperature history of the device after the irradiation impacts the performance of the detector, linked to the mobility of defects at different temperatures. The initial results from an e2v technologies p-channel CCD204 irradiated at 153 K with 10-MeV equivalent proton fluences of 1.24×109 and 1.24×1011  protonscm2 is described. The dark current, cosmetic quality, and the number of defects identified using trap pumping immediately were monitored after the irradiation for a period of 150 h with the device held at 153 K and then after different periods of time at room temperature. The device also exhibited a flatband voltage shift of around 30  mV/krad, determined by the reduction in full well capacity.

© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Jason P. D. Gow ; Daniel Wood ; Neil J. Murray ; David Burt ; David J. Hall, et al.
"Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K", J. Astron. Telesc. Instrum. Syst. 2(2), 026001 (Jun 09, 2016). ; http://dx.doi.org/10.1117/1.JATIS.2.2.026001


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