The TolTEC camera: an overview of the instrument and in-lab testing results

Grant W. Wilson; Sophia Abi-Saad; Peter Ade; Itziar Aretxaga; Jason Austermann; Yvonne Ban; Joseph Bardin; James Beall; Marc Berthoud; Sean Bryan; John Bussan; Edgar Castillo; Miguel Chavez; Reid Contente; N. S. DeNigris; Bradley Dober; Miranda Eiben; Daniel Ferrusca; Laura Fissel; Jiansong Gao; Joseph E. Golec; Robert Golina; Arturo Gomez; Sam Gordon; Robert Gutermuth; Gene Hilton; Mohsen Hosseini; Johannes Hubmayr; David Hughes; Stephen Kuczarski; Dennis Lee; Emily Lunde; Zhiyuan Ma; Hamdi Mani; Philip Mauskopf; Michael McCrackan; Christopher McKenney; Jeffrey McMahon; Giles Novak; Giampaolo Pisano; Alexandra Pope; Amy Ralston; Ivan Rodriguez; David Sánchez-Argüelles; F. Peter Schloerb; Sara Simon; Adrian Sinclair; Kamal Souccar; Ana Torres Campos; Carole Tucker; Joel Ullom; Eric Van Camp; Jeff Van Lanen; Miguel Velazquez; Michael Vissers; Eric Weeks; Min S. Yun

doi:10.1117/12.2562331

13 December 2020 The TolTEC camera: an overview of the instrument and in-lab testing results

Grant W. Wilson, Sophia Abi-Saad, Peter Ade, Itziar Aretxaga, Jason Austermann, Yvonne Ban, Joseph Bardin, James Beall, Marc Berthoud, Sean Bryan, John Bussan, Edgar Castillo, Miguel Chavez, Reid Contente, N. S. DeNigris, Bradley Dober, Miranda Eiben, Daniel Ferrusca, Laura Fissel, Jiansong Gao, Joseph E. Golec, Robert Golina, Arturo Gomez, Sam Gordon, Robert Gutermuth, Gene Hilton, Mohsen Hosseini, Johannes Hubmayr, David Hughes, Stephen Kuczarski, Dennis Lee, Emily Lunde, Zhiyuan Ma, Hamdi Mani, Philip Mauskopf, Michael McCrackan, Christopher McKenney, Jeffrey McMahon, Giles Novak, Giampaolo Pisano, Alexandra Pope, Amy Ralston, Ivan Rodriguez, David Sánchez-Argüelles, F. Peter Schloerb, Sara Simon, Adrian Sinclair, Kamal Souccar, Ana Torres Campos, Carole Tucker, Joel Ullom, Eric Van Camp, Jeff Van Lanen, Miguel Velazquez, Michael Vissers, Eric Weeks, Min S. Yun

Author Affiliations +

Proceedings Volume 11453, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X; 1145302 (2020) https://doi.org/10.1117/12.2562331
Event: SPIE Astronomical Telescopes + Instrumentation, 2020, Online Only

Abstract

TolTEC is a three-band imaging polarimeter for the Large Millimeter Telescope. Simultaneously observing with passbands at 1.1mm, 1.4mm and 2.0mm, TolTEC has diffraction-limited beams with FWHM of 5, 7, and 11 arcsec, respectively. Over the coming decade, TolTEC will perform a combination of PI-led and Open-access Legacy Survey projects. Herein we provide an overview of the instrument and give the first quantitative measures of its performance in the lab prior to shipping to the telescope in 2021.

Conference Presentation

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Grant W. Wilson, Sophia Abi-Saad, Peter Ade, Itziar Aretxaga, Jason Austermann, Yvonne Ban, Joseph Bardin, James Beall, Marc Berthoud, Sean Bryan, John Bussan, Edgar Castillo, Miguel Chavez, Reid Contente, N. S. DeNigris, Bradley Dober, Miranda Eiben, Daniel Ferrusca, Laura Fissel, Jiansong Gao, Joseph E. Golec, Robert Golina, Arturo Gomez, Sam Gordon, Robert Gutermuth, Gene Hilton, Mohsen Hosseini, Johannes Hubmayr, David Hughes, Stephen Kuczarski, Dennis Lee, Emily Lunde, Zhiyuan Ma, Hamdi Mani, Philip Mauskopf, Michael McCrackan, Christopher McKenney, Jeffrey McMahon, Giles Novak, Giampaolo Pisano, Alexandra Pope, Amy Ralston, Ivan Rodriguez, David Sánchez-Argüelles, F. Peter Schloerb, Sara Simon, Adrian Sinclair, Kamal Souccar, Ana Torres Campos, Carole Tucker, Joel Ullom, Eric Van Camp, Jeff Van Lanen, Miguel Velazquez, Michael Vissers, Eric Weeks, and Min S. Yun "The TolTEC camera: an overview of the instrument and in-lab testing results", Proc. SPIE 11453, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X, 1145302 (13 December 2020); https://doi.org/10.1117/12.2562331

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