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20 April 1998 Measurement and spectrometry of fluxes of charged particles using a scintillator-photodiode-preamplifier (S-PD-PA) and new types of scintillators based on semiconductor AIIBVI compounds
Vladimir D. Ryzhikov, Vyacheslav V. Chernikov, Leonid P. Gal'chinetsky, S. N. Galkin, Evgeniy A. Danshin, A. E. Filimonov, Elena K. Lisetskaya, V. G. Volkov
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Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306275
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
Scintillators based on AIIBVI compounds, having relative small effective atomic numbers, can be used for measurement and spectrometry of fluxes of light and heavy charged particles. In this paper we attempted to specify the possibilities and limitations of the development of new types of solid-state detectors of charged particles and corresponding instruments on the basis of CdS(Te) and ZnSe(Te) scintillator single crystals produced by STC RI of the Concern `Institute for Single Crystals'. Principal attention was paid to a promising system S-PD-PA, combined with modern computer facilities. For the best specimens of instruments, we obtained energy resolution for alpha- particles with E(alpha ) equals 5.15 MeV R(alpha ) equals 4- 5%, for electrons with Ee equals 0.624 MeV equals Re equals 11-12%, alpha to beta ratio (alpha) /(gamma) equals 1.0 +/- 0.1, beta to gamma ratio (beta) /(gamma) - more than 100. A possibility is discussed of a combined method of detection and spectrometry of electrons in the energy range of 0.015 - 3.0 MeV using a windowless silicon PIN-PD (0.01 - 3.0 MeV), as well as a scintillation detector comprising a scintillator and a PIN-PD (0.2 - 3.0 MeV).
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Vladimir D. Ryzhikov, Vyacheslav V. Chernikov, Leonid P. Gal'chinetsky, S. N. Galkin, Evgeniy A. Danshin, A. E. Filimonov, Elena K. Lisetskaya, and V. G. Volkov "Measurement and spectrometry of fluxes of charged particles using a scintillator-photodiode-preamplifier (S-PD-PA) and new types of scintillators based on semiconductor AIIBVI compounds", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306275
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KEYWORDS
Scintillators
Crystals
Electrons
Spectroscopy
Particles
Sensors
Semiconductors
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