Paper
19 July 2008 Dielectric constant reduction using porous substrates in finline millimetre and submillimetre detectors
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Abstract
Finlines are planar structures which allow broadband and low loss transition from waveguide to planar circuits. Their planar structure and large substrate makes them ideal for integration with other planar circuits and components, allowing the development of an on chip polarimeter. We have developed a method of extending the employment of finlines to thick substrates with high dielectric constants by drilling or etching small holes into the substrate, lowering the effective dielectric constant. We present the results of scale model measurements at 15GHz and cryogenic measurements at 90GHz which illustrate the excellent performance of finline transitions with porous substrates and the suitability of this technique for extending the bandwidth of finline transitions.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chris E. North, Michael D. Audley, Dorota M. Glowacka, David Goldie, Paul K. Grimes, Bradley R Johnson, Bruno Maffei, Simon J. Melhuish, Lucio Piccirillo, Giampaolo Pisano, Vassilka N. Tsaneva, Stafford Withington, and Ghassan Yassin "Dielectric constant reduction using porous substrates in finline millimetre and submillimetre detectors", Proc. SPIE 7020, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV, 70202G (19 July 2008); https://doi.org/10.1117/12.788479
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KEYWORDS
Dielectrics

Waveguides

Sensors

Silicon

Transformers

Solids

Copper

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