Dr. Erik Waldron
Corporate Scientist at Frontier Technologies Inc.
SPIE Involvement:
Author
Area of Expertise:
Optics , Semiconductors , Star trackers , Focal Plane Arrays , GPS-denied naviagation , EO/IR systems
Websites:
Profile Summary

Erik Waldron received the B.S. degree in physics and the M.S. degree in applied physics from the University of Massachusetts. He received the M.A. degree and Ph.D. degree in physics from Boston University, specializing in condensed matter experiment and researching the optoelectronic properties of III-V superlattices and quantum wells. After earning his doctoral degree in 2002 he joined the Draper Laboratory in Cambridge, MA, where he led efforts on radiation-hard star trackers, focal plane arrays, and GPS-denied navigation in their imaging and sensor systems group as a Senior Optical Physicist. He then joined L-3 SSG in Wilmington, MA as Principal Systems Engineer in the Advanced Programs Group where he researched and led engineering teams in space systems and laser communication. Following SSG Erik Joined United Technologies Aerospace Systems (Airborne ISR) as a Chief Engineer for EO Systems. After leaving United Technologies Aerospace Systems Erik joined Frontier Technologies Inc. as a Corporate Scientist.
Publications (1)

SPIE Journal Paper | 15 May 2015
Patrick Fumo, Erik Waldron, Juha-Pekka Laine, Gary Evans
JATIS, Vol. 1, Issue 02, 028002, (May 2015) https://doi.org/10.1117/12.10.1117/1.JATIS.1.2.028002
KEYWORDS: Point spread functions, Cameras, Imaging systems, Diffraction, Sensors, Silicon, Staring arrays, Image sensors, Light emitting diodes, Active sensors

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