PROCEEDINGS VOLUME 1333
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Advanced Optical Manufacturing and Testing
Editor(s): Gregory M. Sanger, Paul B. Reid, Lionel R. Baker
Editor Affiliations +
IN THIS VOLUME

7 Sessions, 35 Papers, 0 Presentations, 0 Posters
Profilometry  (7)
Metrology I  (4)
Metrology II  (4)
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Advanced Optical Fabrication I
Harvey M. Pollicove, Duncan T. Moore
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22784
Masakazu Miyashita
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22785
Lynn N. Allen, Henry W. Romig
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22786
Robert A. Jones, Wiktor J. Rupp
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22787
Lynn David Bollinger, Gregg M. Gallatin, J. Samuels, G. Steinberg, Charles B. Zarowin
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22788
John K. Myler, Richard A. Parker, A. B. Harrison
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22789
Advanced Optical Fabrication II
Albert V. Baez
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22791
John R. Johnson, Eugene Waluschka
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22793
Dean A. Ketelsen, W. Cary Kittrell, Robert E. Parks, Lianzhen Shao
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22794
William J. Wills-Moren, Keith Carlisle, Patrick A. McKeown, Paul Shore
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22795
Changxin Zhou, Jing-Hong Shao
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22796
Profilometry
Chunsheng Huang, Hwan J. Jeong, Bruce J. Ruff
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22798
Ronald Gamache, John Tourtellott, John F. Wagner
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22799
Yao Lin, Peter Z. Takacs, Karen Furenlid, Robert A. DeBiasse, Runwen Wang
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22800
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22802
William J. Wills-Moren, Peter B. Leadbeater
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22803
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22804
Peter Z. Takacs, Karen Furenlid, Eugene L. Church
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22805
Profilometry and Thin Film Coating
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22807
Thomas E. Gordon
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22808
Lionel R. Baker
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22809
Allan Hornstrup, Finn Erland Christensen, Jorgen Garnaes, Ellen Jespersen, Shou-Hua Zhu, Herbert W. Schnopper
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22811
Sei-ichi Itabashi, Ikuo Okada, Takashi Kaneko, Seitaro Matsuo, Hideo Yoshihara
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22813
Metrology I
Michael F. Kuechel, Wolfgang Wiedmann
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22814
David A. Zweig, Robert E. Hufnagel
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22815
Metrology II
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22817
YenCheng Shen, Gregory P. Ruthven, GonYen Shen
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22818
Peter J. de Groot, Francis X. D'Amato, Edward John Gratrix
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22819
Kenji Endo, Haruo Uemura, Shin-ichi Nagata, Masayoshi Kobayashi, Atsushi Abematsu
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22820
Metrology III
Lawrence J. Cernoch, George Cheney, Carolyn H. Vasisko, Peter H. Vo
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22823
Warren R. Sigman, L. V. Burns, C. Gregory Hull-Allen, Albert F. Slomba, Ray G. Kusha
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22824
Metrology I
Simon Chia-Fu Sheng, Oscar Berendsohn, Martin R. Schreibman, Lester M. Cohen
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22826
Lawrence J. Cernoch
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22827
Advanced Optical Fabrication II
Edara K. Murthy
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22828
Advanced Optical Fabrication I
Donald Golini, Stephen D. Jacobs
Proceedings Volume Advanced Optical Manufacturing and Testing, (1990) https://doi.org/10.1117/12.22829
Back to Top