PROCEEDINGS VOLUME 3966
ELECTRONIC IMAGING | 22-28 JANUARY 2000
Machine Vision Applications in Industrial Inspection VIII
Editor Affiliations +
ELECTRONIC IMAGING
22-28 January 2000
San Jose, CA, United States
Image Processing and Metrology
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380066
Martin Schroeck, Theodore D. Doiron
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380074
Mihailo Ristic, Djordje Brujic, Iain Ainsworth
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380095
Miguel Arias-Estrada, Cesar Torres-Huitzil
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380096
Dan A. Lehotsky
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380097
Edwige E. Pissaloux
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380058
Heinz Hugli, Jose Juarez Gonzalez
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380059
Volumetric and Surface Imaging
Chihhsiong Stone Shih, Lester A. Gerhardt
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380060
Flavio Prieto, Richard Lepage, Pierre Boulanger, Tanneguy Redarce
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380061
W. Harvey Gray, Christophe Dumont, Mongi A. Abidi
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380062
Huicheng Zhou, Jihong Chen, Daoshan Yang, Ji Zhou, Shawn Buckley
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380063
Feature Analysis and Pattern Recognition
HweeLi Thio, Liya Chen, Eam-Khwang Teoh
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380064
Christian Kueblbeck
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380065
Wenyuan Xu, Steven P. Floeder
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380067
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380068
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380069
Thomas P. Karnowski, Kenneth W. Tobin Jr., Regina K. Ferrell, Fred Lakhani
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380070
Measurement of Color and Appearance
Martin J. Pechersky, Larry J. Harpring
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380071
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380072
Kenneth W. Tobin Jr., James S. Goddard Jr., Martin A. Hunt, Kathy W. Hylton, Thomas P. Karnowski, Marc L. Simpson, Roger K. Richards, Dale A. Treece
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380073
Jacco C. Noordam, Gerwoud W. Otten, Toine J. M. Timmermans, Bauke H. van Zwol
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380075
Machine Vision Systems Integration and Process Characterization
Franci Lahajnar, Stanislav Kovacic
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380076
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380077
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380078
Leopoldo Altamirano-Robles, Miguel Arias-Estrada, Samuel Alviso-Quibrera, Aurelio Lopez-Lopez
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380079
Olivier Huesser, Heinz Hugli
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380080
Glenn O. Allgood, Dale A. Treece, David Keith Mee, Larry R. Mooney
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380081
Maria C. Garcia-Alegre, Angela Ribeiro, Domingo Guinea, Gabriel Cristobal
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380082
Poster Session
Minh-Chinh Nguyen, Volker Graefe
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380083
Antoine Lecerf, Denis Ouellet, Miguel Arias-Estrada
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380084
Yulong Cao, Jingyu Yang, Mingwu Ren, Wen Jie Yang
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380085
Domingo Guinea, Victor M. Preciado, Jose Vicente, Angela Ribeiro, Maria C. Garcia-Alegre
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380086
Yonghuai Liu, Marcos Aurelio Rodrigues
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380087
Bingcheng Li, Rene J. Villalobos
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380088
Harry Coomar Shumsher Rughooputh, Soonil D. D. V. Rughooputh, Jason M. Kinser
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380089
Harry Coomar Shumsher Rughooputh, Soonil D. D. V. Rughooputh, Jason M. Kinser
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380090
Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
George G. Li, Weilu H. Xu, Helen Zhu, Dale A. Harrison, A. Rahim Forouhi, Iris Bloomer
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380091
Sen Han, Joseph A. Lamb, Artur G. Olszak, Erik Novak
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380092
Steven W. Meeks
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380093
Poster Session
Mark L. Begbie, John Paul Lesso, Wilson Sibbett, Miles J. Padgett
Proceedings Volume Machine Vision Applications in Industrial Inspection VIII, (2000) https://doi.org/10.1117/12.380094
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