PROCEEDINGS VOLUME 7812
SPIE OPTICAL ENGINEERING + APPLICATIONS | 1-5 AUGUST 2010
Imaging Spectrometry XV
Editor(s): Sylvia S. Shen, Paul E. Lewis
Editor Affiliations +
Proceedings Volume 7812 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
1-5 August 2010
San Diego, California, United States
Front Matter: Volume 7812
Proceedings Volume Imaging Spectrometry XV, 781201 (2010) https://doi.org/10.1117/12.876292
Next-Generation Spectrometer Systems
Proceedings Volume Imaging Spectrometry XV, 781202 (2010) https://doi.org/10.1117/12.860789
Gerald Wong, Andrew R. Harvey, Roger Pilkington, Rick Rickman
Proceedings Volume Imaging Spectrometry XV, 781204 (2010) https://doi.org/10.1117/12.859812
John Cardarelli II, Mark Thomas, Timothy Curry
Proceedings Volume Imaging Spectrometry XV, 781205 (2010) https://doi.org/10.1117/12.863314
Proceedings Volume Imaging Spectrometry XV, 781206 (2010) https://doi.org/10.1117/12.864703
S. Watchorn, J. Noto, J. Anderson, C. E. Sioris
Proceedings Volume Imaging Spectrometry XV, 781207 (2010) https://doi.org/10.1117/12.863173
Spectral Data Analysis Techniques I
S. R. Rotman, N. Bar-Zeev, L. Stern
Proceedings Volume Imaging Spectrometry XV, 78120A (2010) https://doi.org/10.1117/12.859071
Tien C. Bau, Glenn Healey
Proceedings Volume Imaging Spectrometry XV, 78120B (2010) https://doi.org/10.1117/12.865978
Brian M. Flusche, Michael G. Gartley, John R. Schott
Proceedings Volume Imaging Spectrometry XV, 78120C (2010) https://doi.org/10.1117/12.860640
Proceedings Volume Imaging Spectrometry XV, 78120D (2010) https://doi.org/10.1117/12.861055
Spectral Data Analysis Techniques II
Robert T. Kroutil, Sylvia S. Shen, Paul E. Lewis, David P. Miller, John Cardarelli, Mark Thomas, Timothy Curry, Paul Kudaraskus
Proceedings Volume Imaging Spectrometry XV, 78120E (2010) https://doi.org/10.1117/12.863258
Proceedings Volume Imaging Spectrometry XV, 78120F (2010) https://doi.org/10.1117/12.862048
Christoph C. Borel, Ronald F. Tuttle, Clyde Spencer
Proceedings Volume Imaging Spectrometry XV, 78120G (2010) https://doi.org/10.1117/12.863110
Wei Xiong, Ching Tsorng Tsai, Ching Wen Yang, Chein-I Chang
Proceedings Volume Imaging Spectrometry XV, 78120H (2010) https://doi.org/10.1117/12.861621
Spectral Methodologies and Applications
James F. Scholl, E. Keith Hege, Daniel G. O'Connell, Eustace L. Dereniak
Proceedings Volume Imaging Spectrometry XV, 78120I (2010) https://doi.org/10.1117/12.862705
Kevin C. Gross, Chris Borel, Allen White, Stephen Sakai, Rebecca DeVasher, Glen P. Perram
Proceedings Volume Imaging Spectrometry XV, 78120J (2010) https://doi.org/10.1117/12.861336
Christoph C. Borel, Ronald F. Tuttle
Proceedings Volume Imaging Spectrometry XV, 78120K (2010) https://doi.org/10.1117/12.863111
Proceedings Volume Imaging Spectrometry XV, 78120L (2010) https://doi.org/10.1117/12.862090
Optical Design and Engineering of Hyperspectral Sensors: Joint Session with Conference 7786
Robert Lucke, John Fisher
Proceedings Volume Imaging Spectrometry XV, 78120M (2010) https://doi.org/10.1117/12.859471
D. W. Warren, R. H Boucher, D. J. Gutierrez, E. R Keim, M. G. Sivjee
Proceedings Volume Imaging Spectrometry XV, 78120N (2010) https://doi.org/10.1117/12.861374
Proceedings Volume Imaging Spectrometry XV, 78120P (2010) https://doi.org/10.1117/12.861331
Proceedings Volume Imaging Spectrometry XV, 78120R (2010) https://doi.org/10.1117/12.859952
Sameet K. Shriyan, Adam K. Fontecchio
Proceedings Volume Imaging Spectrometry XV, 78120S (2010) https://doi.org/10.1117/12.860727
Sensor System Performance Characterization and Optimization
Aaron M. Weiner, David W. Messinger
Proceedings Volume Imaging Spectrometry XV, 78120T (2010) https://doi.org/10.1117/12.859701
Sylvia S. Shen, Paul E. Lewis
Proceedings Volume Imaging Spectrometry XV, 78120U (2010) https://doi.org/10.1117/12.861975
Sylvia S. Shen, David P. Miller, Paul E. Lewis
Proceedings Volume Imaging Spectrometry XV, 78120V (2010) https://doi.org/10.1117/12.862002
Proceedings Volume Imaging Spectrometry XV, 78120W (2010) https://doi.org/10.1117/12.860407
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