PROCEEDINGS VOLUME PC12581
SPIE OPTICS + OPTOELECTRONICS | 24-28 APRIL 2023
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI
Editor Affiliations +
Proceedings Volume PC12581 is from: Logo
SPIE OPTICS + OPTOELECTRONICS
24-28 April 2023
Prague, Czech Republic
Updates on Facilities and New FEL Sources
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258101 https://doi.org/10.1117/12.2669591
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258102 https://doi.org/10.1117/12.2669044
Chao Feng
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258103 https://doi.org/10.1117/12.2666203
Advanced Lasing Sources
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258104 https://doi.org/10.1117/12.2668767
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258105 https://doi.org/10.1117/12.2666392
Zhirong Huang
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258106 https://doi.org/10.1117/12.2669514
Instrumentation/Techniques: X-ray Diagnostic Methods
Konstantin Kharitonov, Mabel Ruiz-Lopez, Barbara Keitel, Elke Plönjes, Alessandro Marras, Jonathan Correa, Cornelia Wunderer
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258107 https://doi.org/10.1117/12.2669094
Markus Ilchen, Sadia Bari, Thomas Baumann, Christopher Behrens, Yilmaz Bican, Mahdi Bidhendi, Rebecca Boll, Markus Braune, Günter Brenner, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258108 https://doi.org/10.1117/12.2669164
Instrumentation/Techniques: X-ray Optics & Beam Delivery
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258109 https://doi.org/10.1117/12.2666473
Instrumentation/Techniques: Instruments
Günter Brenner, Elke Plönjes, Mabel López-Ruiz, Luca Poletto, Maciej Brachmanski, Holger Weigelt, Mathias Hesse, Horst Schulte-Schrepping, Siarhei Dziarzhytski, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810A https://doi.org/10.1117/12.2668789
Saehwan Chun
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810B https://doi.org/10.1117/12.2669159
Joana Valerio
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810C https://doi.org/10.1117/12.2669072
Instrumentation/Techniques: Detector & Data Techniques
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810D https://doi.org/10.1117/12.2669195
Scientific Experiment Results
Rebecca Boll
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810E https://doi.org/10.1117/12.2669171
Roman Mankowsky, Mathias Sander, Serhane Zerdane, Jakub Vonka, Marek Bartkowiak, Yunpei Deng, Rafael Winkler, Flavio Giorgianni, Guy Matmon, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810G https://doi.org/10.1117/12.2669054
Poster Session
HyoJung Hyun, Seonghan Kim, Sunmin Hwang, Hoyoung Jang, Garam Hahn, Donghyun Song, Seungcheol Lee
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810I https://doi.org/10.1117/12.2666303
Jake Koralek
Proceedings Volume X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810L https://doi.org/10.1117/12.2666932
Back to Top