Presentation
16 March 2023 A universal method for sensorless adaptive microscopy: a physics-embedded machine learning approach (Conference Presentation)
Author Affiliations +
Abstract
Aberrations are a common problem in microscopes resulting in compromised imaging contrast and resolution. Adaptive optics (AO) can correct aberrations but requires either a wavefront sensor or a wavefront-sensorless AO method that requires multiple sample exposures. We created a machine learning (ML) approach that embeds physical understanding of the imaging process into a sensorless AO method. This enables correction of aberrations with as few as two sample exposures. The method was translated across different microscope modalities. This includes two-photon microscopy and three-photon microscopy of in vivo mouse neural activity, showing robustness to specimen motion and activity related intensity variations.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qi Hu, Martin Hailstone, Jingyu Wang, Matthew Wincott, Huriye Antilgan, Richard Parton, Danail Stoychev, Jacopo Antonello, Adam Packer, and Martin Booth "A universal method for sensorless adaptive microscopy: a physics-embedded machine learning approach (Conference Presentation)", Proc. SPIE PC12388, Adaptive Optics and Wavefront Control for Biological Systems IX, PC1238802 (16 March 2023); https://doi.org/10.1117/12.2649347
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KEYWORDS
Adaptive optics

Sensors

Machine learning

Microscopy

Microscopes

Point spread functions

Imaging systems

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