Paper
5 September 1980 Relationship Between Micro And Macro Reproduction Characteristics Of Kodak High Resolution Plates
Robert E. Doran
Author Affiliations +
Abstract
Traditional measurements of photographic sensitivity have been of little value to microelectronics mask makers. The primary concerns of the mask maker are control of microimagery dimensions and adequate developed density through variation in exposure. The macro characteristic curve or D-log E curve has been considered virtually meaningless in this application. This paper examines two of the micro characteristics of KODAK High Resolution Plates - the microcharacteristic curve relating linewidth to the logarithm of the exposure and the derivative, d(W)/d(log E), relating the rate of change of linewidth with log Exposure. The limited linear relationship between linewidth and macro density is examined. Representative data from a number of production coatings of KODAK High Resolution Plates are illustrated to examine the usefulness of macro density as a predictor of linewidth.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert E. Doran "Relationship Between Micro And Macro Reproduction Characteristics Of Kodak High Resolution Plates", Proc. SPIE 0221, Developments in Semiconductor Microlithography V, (5 September 1980); https://doi.org/10.1117/12.958637
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KEYWORDS
Photography

Photomasks

Printing

Optical lithography

Semiconductors

Critical dimension metrology

Mask making

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