Paper
15 May 1981 Image Derotation System For The Study In Real Time Of The Temperature Patterns On Rotating Components
P. Waddell, K. Hamilton, A. Nicol, S. Fraser
Author Affiliations +
Proceedings Volume 0236, 1980 European Conf on Optical Systems and Applications; (1981) https://doi.org/10.1117/12.958995
Event: 1980 European Conference on Optical Systems and Applications, 1980, Utrecht, Netherlands
Abstract
A simple low cost image derotation system has been devised and used to render optically stationary the infra red images of high speed rotating hot components. The derotator has been specially designed to utilise to the maximum reflective surfaces and not transmissive optics, in order to pass the maximum range of infra red-wavelengths (or the range of component temperatures being measured). The derotated or non-rotating image of the hot rotating component is focussed on to a small sheet of encapsulated chloresteric liquid crystals, the invisible infra red image being rendered visible in colour by the liquid crystal sheet. It is concluded from the results obtained from the preliminary experiments presented in this paper that the image derotator-liquid crystal unit so described should prove to be a useful tool for the engineer. Real time whole field maps of thermal patterns are of vital importance to the engineer, providing knowledge of the effect of those thermal patterns on the component material properties, which in turn affect the vibration and centrifugal stress patterns associated with rotating components.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Waddell, K. Hamilton, A. Nicol, and S. Fraser "Image Derotation System For The Study In Real Time Of The Temperature Patterns On Rotating Components", Proc. SPIE 0236, 1980 European Conf on Optical Systems and Applications, (15 May 1981); https://doi.org/10.1117/12.958995
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KEYWORDS
Prisms

Liquid crystals

Mirrors

Image transmission

Beam splitters

Crystals

Temperature metrology

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