Some New Aspects Of Development Of High Resolution Fourier Transform Spectroscopy In The Far Infrared

J. Kauppinen

doi:10.1117/12.932129

29 October 1981 Some New Aspects Of Development Of High Resolution Fourier Transform Spectroscopy In The Far Infrared

J. Kauppinen

Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932129
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States

Abstract

High resolution Fourier transform spectroscopy at the University of Oulu is based on the double-beam Fourier transform spectrometer constructed here. The instrument works between 20 and 1200 cm^-1 with a practical resolution of better than 0.010 cm^-1. The maximum optical path difference in the interferometer is 1.5 m giving a theoretical resolution of about 0.004 cm^-1. The wavenumber precision of the instrument was found to be ±0.0005 cm^-1. The practical resolution is limited by a signal-to-noise ratio accepted in spectral analysis. In the far infrared noise mainly originates in the detector and radiation source (black body radiator). Some new techniques aimed at eliminating these disadvantages will be presented. Also, some new computation methods will be pointed out.

Citation Download Citation

J. Kauppinen "Some New Aspects Of Development Of High Resolution Fourier Transform Spectroscopy In The Far Infrared", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); https://doi.org/10.1117/12.932129

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