High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials

W. W. Ho

doi:10.1117/12.934151

5 April 1983 High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials

W. W. Ho

Proceedings Volume 0362, Scattering in Optical Materials II; (1983) https://doi.org/10.1117/12.934151
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

Experimental methods have been developed to determine the millimeter wave dielectric properties of materials at temperatures up to 1600°C. Accuracies of the order of ±1.5% for dielectric constant measurements and ±5% with a detection limit of ±0.0001 for loss tangent measurement over the entire temperature range have been demonstrated.

Citation Download Citation

W. W. Ho "High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials", Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); https://doi.org/10.1117/12.934151

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