Analytical Applications Of FT-IR

D. E. Pivonka; R, C. Fry; W. G. Fateley

doi:10.1117/12.970732

20 December 1985 Analytical Applications Of FT-IR

D. E. Pivonka, R, C. Fry, W. G. Fateley

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970732
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

Fourier Transform atomic emission spectroscopy is well suited to the determination of nonmetals in the red to near infrared region from 7,900 to 15,800 cm-1 (1) . The speed of Fourier Transform spectroscopy allows full spectrum monitoring of transient atomic emissions on a time scale as short as 0.5 s. The present report demonstrates new applications of this system for "on the fly" collection of nonmetal atomic emission spectra produced as gas chromatographic effluent is introduced into an atmospheric pressure helium microwave induced plasma (MIP). Simultaneous multi-element determination of C, H, N, 0, S, Si, P, F, Cl, Br, and I is now possible with the red to NIR Fourier transform atomic emission spectrometer.

Citation Download Citation

D. E. Pivonka, R, C. Fry, and W. G. Fateley "Analytical Applications Of FT-IR", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970732

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