Interferometric Measurements Of Remote Surfaces Profile's Through An Optical Fiber

Jose E. Calatroni; Carmen Sainz; Gilbert Tribillon

doi:10.1117/12.947588

16 January 1989 Interferometric Measurements Of Remote Surfaces Profile's Through An Optical Fiber

Jose E. Calatroni, Carmen Sainz, Gilbert Tribillon

Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947588
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States

Abstract

An interferometric profilometer with fiber transmission of the 1-D surface profile is presented. The system works in real time by purely optical means. A CCD linear array is used as a light detector. The received interferogram is processed by a microcomputer. Depth resolution is up to λ/256.

Citation Download Citation

Jose E. Calatroni, Carmen Sainz, and Gilbert Tribillon "Interferometric Measurements Of Remote Surfaces Profile's Through An Optical Fiber", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947588

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