Concentricity Using Sub-Pixel Dimensional Measurement

John C. Schultz; Frederick M. Waltz

doi:10.1117/12.948972

21 March 1989 Concentricity Using Sub-Pixel Dimensional Measurement

John C. Schultz, Frederick M. Waltz

Proceedings Volume 1004, Automated Inspection and High-Speed Vision Architectures II; (1989) https://doi.org/10.1117/12.948972
Event: 1988 Cambridge Symposium on Advances in Intelligent Robotics Systems, 1988, Boston, MA, United States

Abstract

This paper reviews high-precision object location and concentricity measurement using standard TV cameras and a combination of resampling and least-squares model fitting. The computationally intensive resampling calculations were implemented via real-time hardware, using a separable 8 x 8 point approximation to a sinc(x) function. A software approach was used for the least-squares estimation. Particular emphasis is placed on the effects of lighting, part appearance, and environmental factors which ultimately determine system performance.

Citation Download Citation

John C. Schultz and Frederick M. Waltz "Concentricity Using Sub-Pixel Dimensional Measurement", Proc. SPIE 1004, Automated Inspection and High-Speed Vision Architectures II, (21 March 1989); https://doi.org/10.1117/12.948972

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