Application of thin dielectric films in low coherence fiber-optic Fabry-Pérot sensing interferometers: comparative study

Marzena Hirsch; Paweł Wierzba; Małgorzata Jędrzejewska-Szczerska

doi:10.1117/12.2245841

10 November 2016 Application of thin dielectric films in low coherence fiber-optic Fabry-Pérot sensing interferometers: comparative study

Marzena Hirsch, Paweł Wierzba, Małgorzata Jędrzejewska-Szczerska

Author Affiliations +

Proceedings Volume 10161, 14th International Conference on Optical and Electronic Sensors; 101610D (2016) https://doi.org/10.1117/12.2245841
Event: 14th International Conference on Optical and Electronic Sensors, 2016, Gdansk, Poland

Abstract

We examine the application of selected thin dielectric films, deposited by atomic layer deposition (ALD), in a low coherence fiber-optic Fabry-Pérot interferometer designed for sensing applications. Such films can be deposited on the end-face of a single mode optical fiber (SMF-28) in order to modify the reflectivity of the Fabry-Pérot cavity, to provide protection of the fibers from aggressive environments or to create a multi-cavity interferometric sensor. Spectral reflectance of films made from zinc oxide (ZnO), titanium dioxide (TiO₂), aluminum oxide (Al₂O₃) and boron nitride (BN) was calculated for various thickness of the films and compared. The results show that the most promising materials for use in fiber-optic Fabry-Pérot interferometer are TiO₂ and ZnO, although Al₂O₃ is also suitable for this application.

Citation Download Citation

Marzena Hirsch, Paweł Wierzba, and Małgorzata Jędrzejewska-Szczerska "Application of thin dielectric films in low coherence fiber-optic Fabry-Pérot sensing interferometers: comparative study", Proc. SPIE 10161, 14th International Conference on Optical and Electronic Sensors, 101610D (10 November 2016); https://doi.org/10.1117/12.2245841

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