The end-to-end simulator for the E-ELT HIRES high resolution spectrograph

M. Genoni; M. Landoni; M. Riva; G. Pariani; E. Mason; P. Di Marcantonio; K. Disseau; I. Di Varano; O. Gonzalez; P. Huke; H. Korhonen; Gianluca Li Causi

doi:10.1117/12.2271953

26 June 2017 The end-to-end simulator for the E-ELT HIRES high resolution spectrograph

M. Genoni, M. Landoni, M. Riva, G. Pariani, E. Mason, P. Di Marcantonio, K. Disseau, I. Di Varano, O. Gonzalez, P. Huke, H. Korhonen, Gianluca Li Causi

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Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 103290Z (2017) https://doi.org/10.1117/12.2271953
Event: SPIE Optical Metrology, 2017, Munich, Germany

Abstract

We present the design, architecture and results of the End-to-End simulator model of the high resolution spectrograph HIRES for the European Extremely Large Telescope (E-ELT). This system can be used as a tool to characterize the spectrograph both by engineers and scientists. The model allows to simulate the behavior of photons starting from the scientific object (modeled bearing in mind the main science drivers) to the detector, considering also calibration light sources, and allowing to perform evaluation of the different parameters of the spectrograph design. In this paper, we will detail the architecture of the simulator and the computational model which are strongly characterized by modularity and flexibility that will be crucial in the next generation astronomical observation projects like E-ELT due to of the high complexity and long-time design and development. Finally, we present synthetic images obtained with the current version of the End-to-End simulator based on the E-ELT HIRES requirements (especially high radial velocity accuracy). Once ingested in the Data reduction Software (DRS), they will allow to verify that the instrument design can achieve the radial velocity accuracy needed by the HIRES science cases.

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M. Genoni, M. Landoni, M. Riva, G. Pariani, E. Mason, P. Di Marcantonio, K. Disseau, I. Di Varano, O. Gonzalez, P. Huke, H. Korhonen, and Gianluca Li Causi "The end-to-end simulator for the E-ELT HIRES high resolution spectrograph", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103290Z (26 June 2017); https://doi.org/10.1117/12.2271953

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