Present status of metrology of electro-optical surveillance  systems

K. Chrzanowski

doi:10.1117/12.2279608

6 October 2017 Present status of metrology of electro-optical surveillance systems

K. Chrzanowski

Proceedings Volume 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV; 104330W (2017) https://doi.org/10.1117/12.2279608
Event: SPIE Security + Defence, 2017, Warsaw, Poland

Abstract

There has been a significant progress in equipment for testing electro-optical surveillance systems over the last decade. Modern test systems are increasingly computerized, employ advanced image processing and offer software support in measurement process. However, one great challenge, in form of relative low accuracy, still remains not solved. It is quite common that different test stations, when testing the same device, produce different results. It can even happen that two testing teams, while working on the same test station, with the same tested device, produce different results. Rapid growth of electro-optical technology, poor standardization, limited metrology infrastructure, subjective nature of some measurements, fundamental limitations from laws of physics, tendering rules and advances in artificial intelligence are major factors responsible for such situation. Regardless, next decade should bring significant improvements, since improvement in measurement accuracy is needed to sustain fast growth of electro-optical surveillance technology.

Citation Download Citation

K. Chrzanowski "Present status of metrology of electro-optical surveillance systems", Proc. SPIE 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV, 104330W (6 October 2017); https://doi.org/10.1117/12.2279608

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KEYWORDS

Imaging systems

Standards development

Metrology

Thermography

Night vision

Night vision systems

Surveillance systems

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