Metrology for the manufacturing of freeform optics

Todd Blalock; Brian Myer; Ian Ferralli; Matt Brunelle; Tim Lynch

doi:10.1117/12.2279819

16 October 2017 Metrology for the manufacturing of freeform optics

Todd Blalock, Brian Myer, Ian Ferralli, Matt Brunelle, Tim Lynch

Proceedings Volume 10448, Optifab 2017; 1044817 (2017) https://doi.org/10.1117/12.2279819
Event: SPIE Optifab, 2017, Rochester, New York, United States

Abstract

Recently the use of freeform surfaces have become a realization for optical designers. These non-symmetrical optical surfaces have allowed unique solutions to optical design problems. The implementation of freeform optical surfaces has been limited by manufacturing capabilities and quality. However over the past several years freeform fabrication processes have improved in capability and precision. But as with any manufacturing, proper metrology is required to monitor and verify the process. Typical optics metrology such as interferometry has its challenges and limitations with the unique shapes of freeform optics. Two contact metrology methods for freeform metrology are presented; a Leitz coordinate measurement machine (CMM) with an uncertainty of ± 0.5 μm and a high resolution profilometer (Panasonic UA3P) with a measurement uncertainty of ± 0.05 μm. We are also developing a non-contact high resolution technique based on the fringe reflection technique known as deflectometry. This fast non-contact metrology has the potential to compete with accuracies of the contact methods but also can acquire data in seconds rather than minutes or hours.

Citation Download Citation

Todd Blalock, Brian Myer, Ian Ferralli, Matt Brunelle, and Tim Lynch "Metrology for the manufacturing of freeform optics", Proc. SPIE 10448, Optifab 2017, 1044817 (16 October 2017); https://doi.org/10.1117/12.2279819

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KEYWORDS

Metrology

Deflectometry

Freeform optics

Optics manufacturing

Manufacturing

Profilometers

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