Paper
19 May 1989 A Theoretical Analysis for Media Life Estimation Using Error Rate
Hideki Okazaki, Tatsuya Sasaoka, Yasuaki Nakane, Tadashi Kiyomiya, Hiroshi Makino, Tokuei Aoki
Author Affiliations +
Proceedings Volume 1078, Optical Data Storage Topical Meeting; (1989) https://doi.org/10.1117/12.952742
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
Statistical analysis on a life time probability of optical recording media is studied. Byte error rate change under accelerated environments was applied to plot on an Arrhenius' scale. Assuming an error generation model where an error is caused by combination of noise generated in a disk and drive, following equation can be obtained; BER = Ao exp [ C exp( - Ea / kT ) ) • t 1. The analysis result suggested that the life time probability distributed normally on an Arrhenius' time scale. Experimental results on high temperature and high humidity accelerated test were in good agreement with the analysis. The life time of 99.9% our magneto-optical media were expected to be longer than 25 years in an office environment.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hideki Okazaki, Tatsuya Sasaoka, Yasuaki Nakane, Tadashi Kiyomiya, Hiroshi Makino, and Tokuei Aoki "A Theoretical Analysis for Media Life Estimation Using Error Rate", Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); https://doi.org/10.1117/12.952742
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Cited by 2 scholarly publications.
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KEYWORDS
Error analysis

Statistical analysis

Interference (communication)

Molybdenum

Adaptive optics

Optical storage

Signal processing

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