A device for comprehensive performance test of photoelectric system

Xiaomei Chen; Changjiang Liu; Leili Hu; Baolin Du

doi:10.1117/12.2505263

18 January 2019 A device for comprehensive performance test of photoelectric system

Xiaomei Chen, Changjiang Liu, Leili Hu, Baolin Du

Proceedings Volume 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 1083911 (2019) https://doi.org/10.1117/12.2505263
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

The common methods for measuring the consistency of optical axis of multispectral and multi optical axis optoelectronic system are introduced in detail in this paper. The advantages and disadvantages of various methods are analyzed in detail. For the latest test requirements for the multi optical axis consistency of the current photoelectric system, a set of new test schemes for measuring the consistency of the laser emission axis and the sight axis, ant the laser receiving axis and the sight axis are designed. The device can also test the detection sensitivity and resolution of photoelectric system. The shortcoming of the old scheme, that can not be tested for laser receiving optical axis consistency , is soved. The design results show that the whole testing system meets the development trend of automation and lightweight, possessing extensive application prospect of optical axis consistency testing system.

Citation Download Citation

Xiaomei Chen, Changjiang Liu, Leili Hu, and Baolin Du "A device for comprehensive performance test of photoelectric system", Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 1083911 (18 January 2019); https://doi.org/10.1117/12.2505263

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