Paper
25 July 1989 New Stepper For Large-Area Lithography
David S. Holbrook, Mark S. Lucas, Arthur E. Purcell
Author Affiliations +
Abstract
The need for large substrate, high-throughput, lithographic tools has led to the development of the MRS 4500 PanelPrinter. This new stepper combines image field stitching technology with a long-travel, air-bearing stage to achieve four micrometer (μm) design rules over a 450 by 450 millimeter substrate. In order to produce sufficient throughput, the PanelPrinter utilizes a novel architecture which employs multiple optical projection systems to create a single, large-area image. This paper presents a description of the PanelPrinter's system architecture and provides performance data to illustrate resolution, image distortion, and overlay performance on large-area images. Special emphasis is given to the on-board metrology systems which provide the stability and precision required to perform large scale lithography.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David S. Holbrook, Mark S. Lucas, and Arthur E. Purcell "New Stepper For Large-Area Lithography", Proc. SPIE 1088, Optical/Laser Microlithography II, (25 July 1989); https://doi.org/10.1117/12.953148
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Cameras

Reticles

Calibration

Laser optics

Distortion

Metrology

Fiber optic illuminators

RELATED CONTENT

Micrascan II overlay error analysis
Proceedings of SPIE (May 17 1994)
ArF step and scan system with 0.75 NA for the...
Proceedings of SPIE (September 14 2001)
Multisensor system self-calibration
Proceedings of SPIE (September 13 1995)
Automatic on-line wafer stepper calibration system
Proceedings of SPIE (June 01 1990)
SMART SET An Integrated Approach to Stepper Set...
Proceedings of SPIE (January 02 1986)

Back to Top