AbloCAM: a versatile optomechanical, semi-automated tool for an in situ characterization and optimization of focused XUV/x-ray laser beam (Conference Presentation)

Katerina Juránová; Tomáš Burian; Vera Hájková; Jan Hošek; Libor Juha; Jan Kybic; Šárka Nemcová; Bohdan Petryshak; Vojtech Vozda; Ludek Vyšín; Jaromír Chalupský

doi:10.1117/12.2524883

14 May 2019 AbloCAM: a versatile optomechanical, semi-automated tool for an in situ characterization and optimization of focused XUV/x-ray laser beam (Conference Presentation)

Katerina Juránová, Tomáš Burian, Vera Hájková, Jan Hošek, Libor Juha, Jan Kybic, Šárka Nemcová, Bohdan Petryshak, Vojtech Vozda, Ludek Vyšín, Jaromír Chalupský

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Proceedings Volume 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII; 1103506 (2019) https://doi.org/10.1117/12.2524883
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

For quick, efficient and accurate alignment and characterization of focused short-wavelength (i.e., extreme ultraviolet, soft x-ray, and x-ray) laser beams directly in the vacuum interaction chambers, an instrument has to be developed and implemented. AbloCAM should represent such a handy tool looking at ablation imprints of the beam in a suitable material without breaking vacuum and need for a liberation of exposed samples from the chamber to analyse them ex situ. First steps we made in this direction can be found in ref. [1] The technique of the fluence scan (F-scan method; for details see [2,3]), proven at several FEL facilities, e.g., FLASH (Free-electron LASer in Hamburg) and LCLS (Linac Coherent Light Source), makes possible to characterize the beam utilizing just an outer contour of the damage pattern. It is not necessary to measure a crater profile for the beam reconstruction. Not only lateral, but also a longitudinal distribution of irradiance can be determined in the focused beam by its imprinting (z-scan method [4]). Technically, the AbloCAM tool consists of a vacuum compatible motorized positioning system executing a series of well-defined irradiations of a chosen slab target according to algorithms fulfilling requirements of the combined F(z)-scan procedure. Damage patterns formed in that way should then be visualized in situ by means of Nomarski (DIC – Differential Interference Contrast) microscope equipped with the software which indicates and processes pattern outer contours. There is a feedback established between positioning and inspecting components and functions of the tool. The software helps to align and characterize any focused beam in the interaction chamber semi-automatically in a reasonable time.

Conference Presentation

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Katerina Juránová, Tomáš Burian, Vera Hájková, Jan Hošek, Libor Juha, Jan Kybic, Šárka Nemcová, Bohdan Petryshak, Vojtech Vozda, Ludek Vyšín, and Jaromír Chalupský "AbloCAM: a versatile optomechanical, semi-automated tool for an in situ characterization and optimization of focused XUV/x-ray laser beam (Conference Presentation)", Proc. SPIE 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII, 1103506 (14 May 2019); https://doi.org/10.1117/12.2524883

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KEYWORDS

Free electron lasers

X-ray characterization

X-ray lasers

X-rays

Extreme ultraviolet

Laser ablation

Laser development

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