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14 May 2019 Status of the proposed beamlines at the Shanghai soft X-ray FEL (Conference Presentation)
Huaidong Jiang
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Proceedings Volume 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V; 110380G (2019) https://doi.org/10.1117/12.2520990
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic
Abstract
To advance the frontiers of ultrafast X-ray science, Shanghai soft X-ray free-electron laser (SXFEL) user facility was proposed to develop which is now under construction as planned. The SXFEL facility provides ultraintense femtosecond X-ray pulses from 0.1 keV to 1 keV in a repetition rate of 50 Hz. The first phase of the SXFEL includes two beamlines and 5 experimental end-stations. The SXFEL user facility provides some advanced X-ray measurement tools in the research fields of biomaterial, condensed matters, atomic and molecular physics, and novel functional materials by means such as coherent diffraction imaging, time-resolved resonant X-ray scattering, and single-pulse time-resolved x-ray emission spectroscopy etc. In this presentation, I will report the latest status of the beamlines at Shanghai SXFEL.
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Huaidong Jiang "Status of the proposed beamlines at the Shanghai soft X-ray FEL (Conference Presentation)", Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380G (14 May 2019); https://doi.org/10.1117/12.2520990
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KEYWORDS
X-rays
Free electron lasers
X-ray diffraction
X-ray imaging
Atomic, molecular, and optical physics
Coherence imaging
Condensed matter
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