Laser power meters as portable x-ray power monitors

Phil Heimann; David Fritz; Jacek Krzywinski; Stefan Moeller; Dennis Nordlund; Alexander Reid; Peter Stefan; Peter Walter; James Welch

doi:10.1117/12.2526119

24 April 2019 Laser power meters as portable x-ray power monitors

Phil Heimann, David Fritz, Jacek Krzywinski, Stefan Moeller, Dennis Nordlund, Alexander Reid, Peter Stefan, Peter Walter, James Welch

Author Affiliations +

Proceedings Volume 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V; 110380R (2019) https://doi.org/10.1117/12.2526119
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

For the LCLS-II X-ray instruments, we have developed laser power meters as compact X-ray power monitors. A calibration of the responsivity of the power meters was carried out against a silicon photodiode with synchrotron radiation and a gas monitor detector with FEL X-rays. A manipulator with two power meters was installed in various locations at the LCLS. In the LCLS front end, the power meters were compared with the gas detectors, which are calibrated by the electron energy loss method. The agreement between the power meters and the gas detectors was better than 20% at 1500 eV with the pulse energy measured by the gas detectors higher than that from the power meters. In the AMO instrument, the power meters evaluated the improvement in beamline transmission caused by the oxygen plasma cleaning of the Kirkpatrick-Baez mirrors. Measurements were also conducted one and two years later to observe the effect of further contamination of the optical surfaces. Finally at the SXR instrument, the power meters determined the pulse energy at the sample for a beamtime, where the X-ray intensity was an important parameter.

Citation Download Citation

Phil Heimann, David Fritz, Jacek Krzywinski, Stefan Moeller, Dennis Nordlund, Alexander Reid, Peter Stefan, Peter Walter, and James Welch "Laser power meters as portable x-ray power monitors", Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380R (24 April 2019); https://doi.org/10.1117/12.2526119

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