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21 June 2019 Light field three-dimensional measurement
Zewei Cai, Xiaoli Liu, Meihua Liao, Wenqi He, Giancarlo Pedrini, Wolfgang Osten, Xiang Peng
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Proceedings Volume 11056, Optical Measurement Systems for Industrial Inspection XI; 1105628 (2019) https://doi.org/10.1117/12.2526889
Event: SPIE Optical Metrology, 2019, Munich, Germany
Abstract
This letter reports a novel method for light field three-dimensional measurement by using unfocused plenoptic cameras. A light field metric model, based on which nonmetric depths in the image space can be mapped to metric dimensions in the object space, was established. Furthermore, with the aid of a three-dimensional measurement system, light field metric calibration was carried out by determining light rays with spatio-angular parameters and set up the depth relationship between the object and image spaces in accordance with the light field image properties.
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Zewei Cai, Xiaoli Liu, Meihua Liao, Wenqi He, Giancarlo Pedrini, Wolfgang Osten, and Xiang Peng "Light field three-dimensional measurement", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 1105628 (21 June 2019); https://doi.org/10.1117/12.2526889
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KEYWORDS
Calibration
3D metrology
Cameras
3D image reconstruction
Imaging systems
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