Low Temperature Dewar For 1 MeV Electron Transient Testing Of Infrared Focal Plane Arrays

D. B. Reynolds; E. W. Atkins; D. L. Rawlins

doi:10.1117/12.960693

25 September 1989 Low Temperature Dewar For 1 MeV Electron Transient Testing Of Infrared Focal Plane Arrays

D. B. Reynolds, E. W. Atkins, D. L. Rawlins

Proceedings Volume 1108, Test and Evaluation of Infrared Detectors and Arrays; (1989) https://doi.org/10.1117/12.960693
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

A low infrared background helium dewar has been built to evaluate the response and recovery of infrared focal plane arrays to transient electron bursts with mean source energy of 1.4 MeV. The dewar has thin beryllium windows in the vacuum and helium shields, open areas in the nitrogen shield, and a mount that allows the device under test to be perpendicular to the incident electron beam. Beryllium provides shield support and optical background reduction while minimizing electron energy absorption. Dose rates as high as 1012 Rad(Si)/s can be achieved at the device under test. A Febetron 705 flash x-ray (FXR) generator at Rockwell International is used to produce the electron beam. The dewar was used with the FXR electron beam generator at various dose rates. The dosimetry performed in the dewar/electron beam environment will be discussed, including an analysis of the electron beam energy spectrum at the device position.

Citation Download Citation

D. B. Reynolds, E. W. Atkins, and D. L. Rawlins "Low Temperature Dewar For 1 MeV Electron Transient Testing Of Infrared Focal Plane Arrays", Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); https://doi.org/10.1117/12.960693

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