Presentation + Paper
9 September 2019 Collaborative development of diffraction-limited beamline optical systems at US DOE light sources
Author Affiliations +
Abstract
An ongoing collaboration among four US Department of Energy (DOE) National Laboratories has demonstrated key technology prototypes and software modeling tools required for new high-coherent flux beamline optical systems. New free electron laser (FEL) and diffraction-limited storage ring (DLSR) light sources demand wavefront preservation from source to sample to achieve and maintain optimal performance. Fine wavefront control was achieved using a novel, roomtemperature cooled mirror system called REAL (resistive element adjustable length) that combines cooling with applied, spatially variable auxiliary heating. Single-grating shearing interferometry (also called Talbot interferometry) and Hartmann wavefront sensors were developed and used for optical characterization and alignment on several beamlines, across a range of photon energies. Demonstrations of non-invasive hard x-ray wavefront sensing were performed using a thin diamond single-crystal as a beamsplitter.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth A. Goldberg, Antoine Wojdyla, Diane Bryant, Weilun Chao, Daniele Cocco, Corey Hardin, Daniel Morton, May Ling Ng, Lance Lee, Lahsen Assoufid, Walan Grizolli, Xianbo Shi, Steve P. Kearney, Michael Wojcik, Yuri Shvyd'ko, Deming Shu, Mourad Idir, and Lei Huang "Collaborative development of diffraction-limited beamline optical systems at US DOE light sources", Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090C (9 September 2019); https://doi.org/10.1117/12.2530817
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Wavefronts

Wavefront sensors

Sensors

X-rays

Optical alignment

Monochromatic aberrations

Back to Top