3-D measurement based on phase-shifting using calibration of light plane

Yingqing Chen; Sining Li; Wei Lu; Zijian Li; Gang Liu

doi:10.1117/12.2531466

17 May 2019 3-D measurement based on phase-shifting using calibration of light plane

Yingqing Chen, Sining Li, Wei Lu, Zijian Li, Gang Liu

Proceedings Volume 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019); 1117008 (2019) https://doi.org/10.1117/12.2531466
Event: Fourteenth National Conference on Laser Technology and Optoelectronics, 2019, Shanghai, China

Abstract

Based on the phase-shifting fringe scanning projection technique using MEMS galvanometer, the threedimensional shape measurement of the object can be realized. However, we found that the experimental results were more sensitive to some experimental parameters. To avoid it, we introduced a light plane calibration model in the threedimensional measurement system. This calibration model avoids the physical measurement of some experimental parameters, and at the same time makes the operation more convenient and faster, and improves the stability and operability of the experiment. Through the detection experiment of the plane, the relative root mean square relative error of the obtained result is 9.155mm, which is greatly improved compared with the previous experimental results, but the result is still not ideal. We discuss some factors affecting the accuracy of the system which can be improved in the future. The experiment proved its feasibility and potential, and the Powell prism and MEMS galvanometer selected are small in size. The dimensions of Powell prism and MEMS galvanometer are 9.0mm 8.0mm and 2.5mm 3.0mm respectively. The miniaturization of equipment is very advantageous for achieving integration and maintenance of the device.

Citation Download Citation

Yingqing Chen, Sining Li, Wei Lu, Zijian Li, and Gang Liu "3-D measurement based on phase-shifting using calibration of light plane", Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 1117008 (17 May 2019); https://doi.org/10.1117/12.2531466

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KEYWORDS

Calibration

Cameras

Phase shifts

Imaging systems

Microelectromechanical systems

CCD cameras

3D metrology

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