Paper
17 May 2019 Principle of PWC method application in ZEMAX
L. Liu, W. J. Chen, C. H. Liu, Y. Li
Author Affiliations +
Proceedings Volume 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019); 111701S (2019) https://doi.org/10.1117/12.2533546
Event: Fourteenth National Conference on Laser Technology and Optoelectronics, 2019, Shanghai, China
Abstract
The mathematical forms of Seidel coefficients are different in ZEMAX and PWC method. They are bridged by the wavefront aberration coefficients. The relationship between the wavefront aberration coefficients and Seidel coefficients in PWC method is derived in detail. The basis of PWC method application in ZEMAX is established.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Liu, W. J. Chen, C. H. Liu, and Y. Li "Principle of PWC method application in ZEMAX", Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 111701S (17 May 2019); https://doi.org/10.1117/12.2533546
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KEYWORDS
Monochromatic aberrations

Wavefront aberrations

Zemax

Wavefronts

Geometrical optics

Ray tracing

Refractive index

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