The formation simulation of laser disturbing effect image

Y. Wang; Q. Chen; H. Lei; X. Zhou; H. Li; G. Ren; R. Zhu

doi:10.1117/12.2533568

17 May 2019 The formation simulation of laser disturbing effect image

Y. Wang, Q. Chen, H. Lei, X. Zhou, H. Li, G. Ren, R. Zhu

Proceedings Volume 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019); 111701Y (2019) https://doi.org/10.1117/12.2533568
Event: Fourteenth National Conference on Laser Technology and Optoelectronics, 2019, Shanghai, China

Abstract

Laser active suppressing jamming is one of the most important technologies in the domain of electro-optical countermeasures. In order to obtain the all-around assessment of laser disturbing effect, we must get the laser disturbing effect image. It is very difficult or impossible to collect the hostile laser disturbing effect image in fact. We proposed a method of laser disturbing effect image’s formation simulation in this paper. For the first time, the simulation flow was introduced on laser disturbing effect image. We respectively simulated the laser energy distribution of diffraction effect, interference effect, scattering effect based on laser propagation theory, and then added to get the total laser energy distribution on the optoelectronic detector. Secondly, laser energy distribution can be converted into image grey distribution according to the operation principle of optoelectronic detector. Laser disturbing effect image was thirdly achieved by fusing image grey distribution of target and background. The consistency of simulation image and experimental result proved that our method was effective and feasible. The research achievement can provide the technical reference for carrying out laser disturbing experiment and the all-around assessment of laser jamming effect.

Citation Download Citation

Y. Wang, Q. Chen, H. Lei, X. Zhou, H. Li, G. Ren, and R. Zhu "The formation simulation of laser disturbing effect image", Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 111701Y (17 May 2019); https://doi.org/10.1117/12.2533568

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