Numerical method for processing frequency measuring signals from microelectronic sensors based on transistor structures with negative differential resistance

Alexander V. Osadchuk; Andriy A. Semenov; Oleksander S. Zviahin; Anton Y. Savytskyi; Paweł Komada; Karlygash Nurseitova

doi:10.1117/12.2536942

6 November 2019 Numerical method for processing frequency measuring signals from microelectronic sensors based on transistor structures with negative differential resistance

Alexander V. Osadchuk, Andriy A. Semenov, Oleksander S. Zviahin, Anton Y. Savytskyi, Paweł Komada, Karlygash Nurseitova

Author Affiliations +

Proceedings Volume 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019; 111765Y (2019) https://doi.org/10.1117/12.2536942
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 2019, Wilga, Poland

Abstract

The application of the proposed mathematical tools, that can be used for signal processing self-generating transducers of physical quantities, are considered. Its operating mechanism is based on frequency modulation, when the frequency deviation depends on the intensity of exposure measurement parameter. It is shown that the action for leveling additive errors in the channel the signal generator is highly stable enough to use approximating second order polynomial.

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Alexander V. Osadchuk, Andriy A. Semenov, Oleksander S. Zviahin, Anton Y. Savytskyi, Paweł Komada, and Karlygash Nurseitova "Numerical method for processing frequency measuring signals from microelectronic sensors based on transistor structures with negative differential resistance", Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111765Y (6 November 2019); https://doi.org/10.1117/12.2536942

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