CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11249 > Article
Presentation
11 March 2020 Deep learning framework enables 3D label-free tracking of immunological synapse using optical diffraction tomography (Conference Presentation)
Moosung Lee, Young-Ho Lee, Jinyeop Song, Geon Kim, YoungJu Jo, HyunSeok Min, Chan Hyuk Kim, YongKeun Park
Author Affiliations +
Proceedings Volume 11249, Quantitative Phase Imaging VI; 112490Y (2020) https://doi.org/10.1117/12.2551132
Event: SPIE BiOS, 2020, San Francisco, California, United States
Abstract
Rapid, label-free, volumetric, and automated assessment in microscopy is necessary to assess the dynamic interactions between lymphocytes and their targets through the immunological synapse (IS) and the relevant immunological functions. However, attempts to realize the automatic tracking of IS dynamics have been stymied by the limitations of imaging techniques and computational analysis methods. Here, we demonstrate the automatic three-dimensional IS tracking by combining optical diffraction tomography and deep-learning-based segmentation. The proposed approach enables quantitative spatiotemporal analyses of IS regarding morphological and biochemical parameters related to its protein densities, offering a novel complementary method to fluorescence microscopy for studies in immunology.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Moosung Lee, Young-Ho Lee, Jinyeop Song, Geon Kim, YoungJu Jo, HyunSeok Min, Chan Hyuk Kim, and YongKeun Park "Deep learning framework enables 3D label-free tracking of immunological synapse using optical diffraction tomography (Conference Presentation)", Proc. SPIE 11249, Quantitative Phase Imaging VI, 112490Y (11 March 2020); https://doi.org/10.1117/12.2551132
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Diffraction
Optical tomography
Tomography
Optical tracking
Microscopy
3D image processing
Stereoscopy
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top