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Two-dimensional refractive index profiles of strip waveguides are directly measured by a refractive near-field technique with a precision of Δn=0.001 and a spatial resolution of 0.8 μm. This technique is nondestructive, and requires minimal sample preparation.
D. Jestel andE. Voges
"Refractive Index Profiling Of Ion Exchanged Glass Waveguides By RNF-Measurements", Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); https://doi.org/10.1117/12.961441
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D. Jestel, E. Voges, "Refractive Index Profiling Of Ion Exchanged Glass Waveguides By RNF-Measurements," Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); https://doi.org/10.1117/12.961441