Active chromatic depth from defocus for industrial inspection

Benjamin Buat; Pauline Trouvé-Peloux; Frédéric Champagnat; Guy Le Besnerais; Thierry Simon

doi:10.1117/12.2554514

30 March 2020 Active chromatic depth from defocus for industrial inspection

Benjamin Buat, Pauline Trouvé-Peloux, Frédéric Champagnat, Guy Le Besnerais, Thierry Simon

Proceedings Volume 11351, Unconventional Optical Imaging II; 113510Z (2020) https://doi.org/10.1117/12.2554514
Event: SPIE Photonics Europe, 2020, Online Only

Abstract

In this paper we propose a new concept for a compact 3D sensor dedicated to industrial inspection, combining chromatic Depth From Defocus (DFD) and structured illumination. Depth is estimated from a single image using local estimation of the defocus blur. As industrial objects usually show poor texture information, which is crucial for DFD, we rely on structured illumination. In contrast with state of the art approaches for active DFD, which project sparse patterns on the scene, our method exploits a dense textured pattern and provides dense depth maps of the scene. Besides, to overcome depth ambiguity and dead zone of DFD with a classical camera, we use an unconventional lens with chromatic aberration, providing spectrally varying defocus blur in the camera color channels. We provide comparisons of depth estimation performance for several projected patterns at various scales based on simulation and real experiments. The proposed method is then qualitatively evaluated on a real industrial object. Finally we discuss the perspectives of this work especially in terms of co-design of an 3D active sensor using DFD.

Conference Presentation

Citation Download Citation

Benjamin Buat, Pauline Trouvé-Peloux, Frédéric Champagnat, Guy Le Besnerais, and Thierry Simon "Active chromatic depth from defocus for industrial inspection", Proc. SPIE 11351, Unconventional Optical Imaging II, 113510Z (30 March 2020); https://doi.org/10.1117/12.2554514

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