Paper
6 December 1989 Refracted Near-Field Characterization Of Ion Exchanged Glass Waveguides And Device Simulation
D. Jestel, E. Voges
Author Affiliations +
Proceedings Volume 1141, 5th European Conf on Integrated Optics: ECIO '89; (1989) https://doi.org/10.1117/12.961912
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France
Abstract
The refractive index profile of single mode integrated optical strip waveguides, fabricated by a field assisted ion exchange process in glass are determined by the refracted near-field technique. Two-dimensional refractive index profiles are directly measured with a precision of Δn = 0.001 and a spatial resolution of 0.8 μm. This technique is nondestructive, and requires minimal sample preparation. Quantitative data of the index profile are obtained, which are the basis for an efficient control of ion exchange processes and a simulation of integrated optical devices. The index profile is scanned automatically yielding the two dimensional index distribution. By the effective index method the depth coordinate of the two-dimensional profile is eliminated and the effective index profile is used for BPM-simulations of devices.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Jestel and E. Voges "Refracted Near-Field Characterization Of Ion Exchanged Glass Waveguides And Device Simulation", Proc. SPIE 1141, 5th European Conf on Integrated Optics: ECIO '89, (6 December 1989); https://doi.org/10.1117/12.961912
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Cited by 1 scholarly publication and 2 patents.
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KEYWORDS
Waveguides

Ion exchange

Refractive index

Integrated optics

Glasses

Ions

Near field

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