Detection Of Tiny Scratches And Cracks On Crystal Under Microscope With Pc-Based Image Processing System

Sing T Bow; Ting Chen

doi:10.1117/12.962316

30 January 1990 Detection Of Tiny Scratches And Cracks On Crystal Under Microscope With Pc-Based Image Processing System

Sing T Bow, Ting Chen

Author Affiliations +

Proceedings Volume 1153, Applications of Digital Image Processing XII; (1990) https://doi.org/10.1117/12.962316
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

Detection of scratches and cracks is a key problem in the quality assurance in crystal production. difficulties in these inspections are due to the fact that such defects are so thin and short that they are almost indiscernible from the textural background of the crystal unless a special illumination and torsional viewing mechanism are provided. The purpose of this paper is to propose an effective method to automatically segment a microscopic image into separate textural structures, and eventually delineate on the quartz blanks their boundaries which show the locations of the cracks and also the scratches.

Citation Download Citation

Sing T Bow and Ting Chen "Detection Of Tiny Scratches And Cracks On Crystal Under Microscope With Pc-Based Image Processing System", Proc. SPIE 1153, Applications of Digital Image Processing XII, (30 January 1990); https://doi.org/10.1117/12.962316

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