Paper
5 November 2020 Deep learning approach for nonlinear structured illumination microscopy
Author Affiliations +
Abstract
We propose that Deep Learning (DL) can be used to improve the performance of nonlinear structured illumination microscopy(NSIM) to enable it to reconstruct a super-resolution image with much less raw image frames. This allows for gentler super-resolution imaging at higher speeds and weakens phototoxicity in the NSIM imaging process. We validate our approach by super-resolution image reconstruction of simulated obtained data.
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Chang Ling, Luping Du, and Xiaocong Yuan "Deep learning approach for nonlinear structured illumination microscopy", Proc. SPIE 11565, AOPC 2020: Display Technology; Photonic MEMS, THz MEMS, and Metamaterials; and AI in Optics and Photonics, 115650P (5 November 2020); https://doi.org/10.1117/12.2576839
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KEYWORDS
Super resolution

Microscopy

Image resolution

Image restoration

Image quality

Spatial resolution

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