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In this study, we developed a novel dual-side view OCT (DSV-OCT) system for thickness measurement on opaque materials. The dual-side view was achieved on conventional swept source OCT platform by creating two symmetrical sampling arms. This allows to image both sides of the material simultaneously and produce the surface contours of the two sides in a single C-scan. Finally, the thickness of the opaque material can be calculated from the two surface contours above. We evaluated the performance of our DSV-OCT using a microscope slide as sample. The results demonstrated that our DSV-OCT has a good capability for thickness measurement on opaque materials with an accuracy of about 3 μm.
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