Dark Field Photographic Techniques For Documenting Optical Surface Contamination.

Kenneth M. Aline; James A. Dowdall

doi:10.1117/12.962868

2 January 1990 Dark Field Photographic Techniques For Documenting Optical Surface Contamination.

Kenneth M. Aline, James A. Dowdall

Proceedings Volume 1165, Scatter from Optical Components; (1990) https://doi.org/10.1117/12.962868
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

Recent developments in the manufacture of flight hardware have created a demand for new techniques for contamination measurements on optical surfaces. The stringent cleanliness requirements imposed by working with these optics prohibit traditional contamination testing. The handling of optical hardware restricts contamination inspection by standard procedures. In order to view and document surface cleanliness, new photographic techniques have been pushed to their limits to record the image of light scattered from particulate contamination on optical surfaces.

Citation Download Citation

Kenneth M. Aline and James A. Dowdall "Dark Field Photographic Techniques For Documenting Optical Surface Contamination.", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); https://doi.org/10.1117/12.962868

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