Presentation + Paper
5 March 2021 Demonstration of uniform 6x6 GaN p-i-n UV avalanche photodiode arrays
Author Affiliations +
Abstract
Front-illuminated p-i-n GaN-based ultraviolet (UV) avalanche photodiodes (APDs) were grown by metalorganic chemical vapor deposition (MOCVD) on 25 mm dia. bulk Ammono® n-GaN substrate having a low etch pit density (EPD) less than 5 × 104 [cm-2] and processed into 6×6 APD arrays. The devices employed N-ion implantation to achieve sidewall passivation. Evaluation of these 6×6 arrays will help to confirm the uniformity of the epitaxial materials and device processing. The maximum avalanche gain reached ~ 3×105 at the breakdown (current limited). The dark current density was 10-9 A/cm2 at reverse bias up to -20 V and the APDs exhibited a reverse breakdown voltage of 81 ± 1 V for all 36 devices without any leaky devices, confirming a high uniformity of the growth and fabrication processes.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marzieh Bakhtiary-Noodeh, Minkyu Cho, Zhiyu Xu, Hoon Jeong, A. Nepomuk Otte, Shyh-Chiang Shen, Theeradetch Detchprohm, Ashok K. Sood, John W. Zeller, Parminder Ghuman, Sachidananda Babu, and Russell D. Dupuis "Demonstration of uniform 6x6 GaN p-i-n UV avalanche photodiode arrays", Proc. SPIE 11686, Gallium Nitride Materials and Devices XVI, 1168614 (5 March 2021); https://doi.org/10.1117/12.2576888
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Cited by 1 scholarly publication.
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KEYWORDS
Gallium nitride

Avalanche photodiodes

Ultraviolet radiation

Avalanche photodetectors

Semiconducting wafers

Dry etching

Ions

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