Paper
2 December 2020 A band-shaped Mura detection method based on unsupervised deep learning
Author Affiliations +
Proceedings Volume 11717, 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics; 117170R (2020) https://doi.org/10.1117/12.2585259
Event: 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics, 2020, Shanghai, China
Abstract
Mura is a phenomenon in which the displays have various uneven display defects. The band-shaped Mura has the characteristics of irregular shape and different sizes. And the new shapes and sizes of Mura may appear at any time during the inspection process. Therefore, traditional image algorithms are difficult to detect the band-shaped Mura anomaly. In response to the above problems, this paper proposes the Res-unetGAN network, which is an unsupervised anomaly detection method based on generative adversarial network. We design resnet50 as the encoding network of the generator to obtain the latent feature vectors. To improve the quality of reconstructed samples, we combine the skipconnection structure into the generator to guide the decoder. The discriminator is a convolutional neural network based on the Depthwise Separable Convolution. The purpose is to distinguish between normal samples and reconstructed samples, and form a game process with the generator. The network only needs normal screen samples during the training process. In the test, since the Mura sample has not been trained, the reconstruction error score of the Mura sample will be higher. After repeated experiments on the band-shaped Mura data set, the highest auc of 0.995 was obtained, which is better than several models for comparison.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
ShuBin Song, ZengQiang Zheng, ShengSen Zhang, WeiFei Ma, and Min Xia "A band-shaped Mura detection method based on unsupervised deep learning", Proc. SPIE 11717, 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics, 117170R (2 December 2020); https://doi.org/10.1117/12.2585259
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