Paper
2 December 2020 Research on high precision laser phase measurement technology for space-based precision ranging
Zi-hao Wang, Zhong-kai Guo, Xu-ling Lin, Yong-chao Zheng
Author Affiliations +
Proceedings Volume 11717, 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics; 117172X (2020) https://doi.org/10.1117/12.2587445
Event: 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics, 2020, Shanghai, China
Abstract
Space gravitational wave detection, extraterrestrial life exploration and high-precision measurement of earth's gravity field have great scientific significance and wide application value. Inter satellite long baseline high-precision laser interferometry ranging technology can obtain high-precision inter satellite displacement variation, which is the key technology of the above space-based scientific engineering. The laser interference system transforms the inter satellite displacement into corresponding interference signals. The above-mentioned scientific plan has put forward extremely high precision, stability and wide bandwidth requirements for laser interference phase measurement. It can be seen that the high-precision laser phase measurement technology has become the bottleneck to further improve the ranging accuracy and stability. This paper researches the progress of high-precision laser phase measurement technology for space-based precision ranging at home and abroad, analyzes the demand of this technology in space-related fields and proposes the key technologies and preliminary schemes to be solved in the research.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zi-hao Wang, Zhong-kai Guo, Xu-ling Lin, and Yong-chao Zheng "Research on high precision laser phase measurement technology for space-based precision ranging", Proc. SPIE 11717, 24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics, 117172X (2 December 2020); https://doi.org/10.1117/12.2587445
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