High-accuracy diffractometer for augmented reality waveguide characterization

Janne Simonen; Mikael Jokinen; Roosa Mäkitalo; Nikhil Pachhandara

doi:10.1117/12.2614766

7 March 2022 High-accuracy diffractometer for augmented reality waveguide characterization

Janne Simonen, Mikael Jokinen, Roosa Mäkitalo, Nikhil Pachhandara

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Proceedings Volume 11931, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) III; 119310H (2022) https://doi.org/10.1117/12.2614766
Event: SPIE AR VR MR, 2022, San Francisco, California, United States

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Janne Simonen, Mikael Jokinen, Roosa Mäkitalo, and Nikhil Pachhandara "High-accuracy diffractometer for augmented reality waveguide characterization", Proc. SPIE 11931, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) III, 119310H (7 March 2022); https://doi.org/10.1117/12.2614766

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