532-nm triature Photonic Doppler Velocimetry

G. Le Blanc; S. Bergey; J. Vich; T. d'Almeida; M. Roudot; J. Luc; Y. Barbarin

doi:10.1117/12.2616569

2 March 2022 532-nm triature Photonic Doppler Velocimetry

G. Le Blanc, S. Bergey, J. Vich, T. d'Almeida, M. Roudot, J. Luc, Y. Barbarin

Proceedings Volume 12016, Optical and Quantum Sensing and Precision Metrology II; 120160X (2022) https://doi.org/10.1117/12.2616569
Event: SPIE OPTO, 2022, San Francisco, California, United States

Abstract

Photonic Doppler Velocimetry (PDV) systems are developed to measure velocities in physics experiments such as ramp compression experiment on novel materials. Better time resolution, in the fast acceleration phase, is required when the velocity reached is limited to few tens of m/s. This resolution being proportional to the wavelength, a green PDV system provides a factor 3 gain compared to a telecom based PDV. Furthermore, a Triature design allows to further increase the time resolution thanks to the phases signal processing. A 532-nm Triature PDV system was realized with singlemode fibers (4.5 µm core diameter) and compared to three standard PDV systems in reproducible ramp compression experiments. To minimize the optical losses, most of the fibers components were fused. The velocity profile measured has oscillations between 0 and 10 m/s. The first velocity peak is reached in 1.0 µs. The 1550-nm homodyne PDV system provides only 6 fringes and it clearly limits the time resolution. The 1550-nm heterodyne PDV system provides hundreds of fringes but variations of about 0.1 m/s are observed. The green homodyne PDV system provides almost the correct velocity profile by Short Time Fourier Transform. The 250-ns long acceleration phase is better resolved applying a signal processing with at least two phases.

Conference Presentation

Citation Download Citation

G. Le Blanc, S. Bergey, J. Vich, T. d'Almeida, M. Roudot, J. Luc, and Y. Barbarin "532-nm triature Photonic Doppler Velocimetry", Proc. SPIE 12016, Optical and Quantum Sensing and Precision Metrology II, 120160X (2 March 2022); https://doi.org/10.1117/12.2616569

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