Poster + Presentation + Paper
30 May 2022 Prediction of the nature of cracking and the paths of crack propagation in nanolayer surface systems based on the method of calculating percolation by nodes and bonds and the scheme of branching processes
Author Affiliations +
Conference Poster
Abstract
Since the operating conditions of nanolayer systems are usually stochastic, modeling the processes occurring in them requires the use of probabilistic methods. The application of the method for calculating percolation by nodes and bonds for solving the problem of stochastic loading of nanolayer structures is facilitated in comparison with those usually used in various physical and technical problems. In this case the impact is not carried out at the boundary of the two-dimensional region of the nanomaterial, with the finding of stresses and strains inside the layer. Instead, stresses and strains are determined in the very surface layer of the material under the influence of an external load. Here we show that with an increase in the number of nodes and bonds in the system, the development of a crack is slow down and that the use of layered systems with a superlattice crystal structure, with minimized internal residual stresses, can provide increased crack resistance.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey N. Grigoriev, Mars S. Migranov, Artem A. Ershov, Vladimir P. Tabakov, and Petr M. Pivkin "Prediction of the nature of cracking and the paths of crack propagation in nanolayer surface systems based on the method of calculating percolation by nodes and bonds and the scheme of branching processes", Proc. SPIE 12091, Image Sensing Technologies: Materials, Devices, Systems, and Applications IX, 120910H (30 May 2022); https://doi.org/10.1117/12.2623064
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Stochastic processes

Mathematical modeling

Multilayers

Resistance

Process modeling

Chromium

Systems modeling

Back to Top