Paper
29 August 2022 Accurate metrology for focal plane astronomical instruments
Author Affiliations +
Abstract
Accurate positioning of opto-mechanical elements in the focal plane of large telescopes is a challenging requirements for many state of the art observational scientific applications. In particular high multiplexing multi object spectroscopy requires precise metrology tools for performing efficient observations and calibrations of the instruments. We have developed a metrology system based on modified commercial off-the-shelf components to reach high performances with a cost effective solution. Our system is based on the photogrammetry technique and on a number of fixed off-axis cameras. The cameras acquire images of the focal plane where metrology targets and references are located. The acquisition is based on Odroid-XU4, a single-board computer running on GNU/Linux. No moving parts in the setup ensures an extremely fast acquisition of the data. The calibration and metrology data processing is based on the computer vision library OpenCV. We present a prototype system and results of the camera calibrations and metrology tests obtained in our laboratory.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Vanzi, C. Bechet, M. Flores, A. Zapata, M. Parra, T. Shen, R. Dunner, and M. Castro "Accurate metrology for focal plane astronomical instruments", Proc. SPIE 12188, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V, 121883Y (29 August 2022); https://doi.org/10.1117/12.2629684
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

Cameras

Metrology

3D acquisition

Distortion

Imaging systems

Optical fibers

RELATED CONTENT

Metric aspects of zoom vision
Proceedings of SPIE (August 01 1990)
MANIFEST metrology toolkit
Proceedings of SPIE (January 03 2020)
Three-dimensional gauging with stereo computer vision
Proceedings of SPIE (September 01 1991)
Camera calibration technique with planar scenes
Proceedings of SPIE (May 22 2003)

Back to Top